Tool to perform controlled longitudinal scoring on peelable semiconductor
Technical sheet
/ Areas of activity
Cable & Connections
Electrical distribution
Industry
/ Spare parts
LSO
/ Use
The ORACL enables the user to score longitudinaly the peelable semiconductive layer in order to peel it off by hand.
Adjustable scoring depths (0.4 / 0.6 / 0.9 / 1.1 mm)